Check your speedMulti-Instrument is a powerful multi-function virtual instrument software. It supports a variety of hardware ranging from sound cards which are available in almost all computers to proprietary ADC and DAC hardware such as NI DAQmx cards and so on. It consists of the following instruments and functions. (1) Oscilloscope: Dual-trace waveform, Waveform addition, subtraction & multiplication, Lissajous Pattern, signal recording. Various digital filters are supported. (2) Spectrum Analyzer: Amplitude spectrum, octave analysis (1/1,1/3,1/6,1/12,1/24, 1/48, 1/96), frequency compensation, frequency weighting (A,B,C,ITU-R 468), peak hold, averaging, measurement of THD, THD+N, SNR, SINAD, Noise Level, IMD, Bandwidth and Crosstalk, phase spectrum, auto correlation function, cross correlation function, coherence function, transfer function (Bode plot), impulse response. Support 55 window functions and window overlap. (3) Signal Generator: Function/Multitone/Arbitrary waveform/Burst/MLS/DTMF/Musical Scales/White Noise/Pink Noise generation. Frequency/amplitude sweep. (4) Multimeter: Voltmeter, sound pressure level meter(dB, dBA, dBB, dBC), frequency counter, RPM meter, counter, duty cycle meter, F/V converter, cycle mean, cycle RMS, vibrometer. (5) Spectrum 3D Plot: It is used to trace the spectrum variation with time. Two types of plots are provided: waterfall and spectrogram. (6) Data Logger: It provides long time data logging function for 129 derived variables, including RMS value, Peak Frequency, Sound Pressure Level, RPM, THD, etc. Up to eight data logger windows can be opened and each window can trace up to 8 variables. The logged data files can be reloaded into the data logger for review. (7) LCR meter: It is used to measure the value of an inductor, a capacitor or a resistor, or the impedance of a network of them. (8) Device Test Plan: Device Test Plan provides a mechanism for you to configure and conduct your own device test steps. It takes the advantage of the sound card's (or other ADC/DAC card's) capability of simultaneous input & output, to generate a stimulus to the Device Under Test (DUT) and acquire the response from that device at the same time. Different stimuli can be generated and the response can be analyzed in different ways.
Version 3.1 adds support for sound card ASIO driver and other ADC/DAC cards. Vibrometer function is added.
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